APAS Series system Configurations

APAS application systems (unit combination)

Configuration-1: Measurement of extinction ratio ¥1,500,000 and up

Configuration-2: Measurement of phase difference (transmitted light) ¥1,800,000 and up

Configuration-3: Measurement of phase difference (with fiber) ¥2,200,000 and up

Configuration-4: Measurement of phase difference (reflected light) ¥2,300,000 and up

Basic configuration diagram

Transmitted light measurement device

Reflected/scattered light measurement device

Principle of phase difference measurement (Senarmont method)

Optical elements are placed in the following sequence: Light source --> polarizer --> sample -->quarter-wave plate --> analyzer --> detector.

The polarizer and the analyzer are assumed to be in a crossed Nichol configuration. Linearly polarized light from the polarizer is generally converted to elliptically polarized light by birefringence of the sample placed diagonally (45°). Then, the elliptically polarized light is converted to linearly polarized light with a tilt of θ° after passing through a quarter-wave plate with the same phase advance axis as the polarizer. Angle θ° is determined by reading the extinction position of the analyzer. The phase difference δ of the sample at that time is given by: δ= (λ/180) x