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Interferometers

Laser componentLaser component

A proven component equipped with a He-Ne laser and fine-tuning mechanism.

Spatial filter componentSpatial filter component

Component for converting light with noise into light with coherent wave fronts.

Collimator lens componentCollimator lens component

A component for converting a laser beam into parallel light, together with spatial filter component.

Mirror componentMirror component

A component for tilting optical path.

Beam splitter componentBeam splitter component

A component for dividing and combining laser light.

Concave mirror componentConcave mirror component

Schlieren device incorporate a pair of concave mirror components.

Screen componentScreen component

A screen for projecting interference fringes.

CCD holder componentCCD holder component

A component for displaying interference fringe on a monitor and for obtaining and sending data to a PC.

Collimation checker componentCollimation checker component

A wedge plate-type sharing interferometer for easier evaluation of beam parallelism (divergence and convergence) during optical adjustment.

Target componentTarget component

Used as a reference to adjust the height and direction of the light path during optical adjustment.

Michelson InterferometersMichelson Interferometers

Has a wide range of applications, including measurement of microscopic length, light wavelength, and wavelength ratio, refractive index, dispersion, surface roughness, and thin films.

Mach-Zehnder InterferometersMach-Zehnder Interferometers

Consisting of mutually independent mirror and beam splitter units that enable broad layout flexibility, Mach-Zehnder interferometers can be used to measure larger samples.

Fizeau InterferometersFizeau Interferometers

Most widespread interferometer; enables measurement of flat and spherical surfaces using a simple configuration. Its reference and measurement optical paths are the same, making this a compact, vibration-resistant system.

Schlieren DevicesSchlieren Devices

If minute sample differences in refractive index exist in the parallel beam, light outgoing from the sample has a slightly divergent optical axis and focuses on a different spot. Eliminating the off-focus light with a knife edge makes it possible to project light with greater contrast.

MICROR SeriesMICROR Series

Our MICROR series products for smaller interferometer systems enable compact system dimensions and more efficient use of space.