Reflection Measurement Systems
- Utilizing "Special Half Mirror", reflected light from sample can efficiently propagate into spectrophotometer. This enables short time measurement of low reflection sample.
- The "Special Half Mirror" blocks reflection from rear surface and realizes accurate measurement without special treatment on sample surface.
- 512 element linear PDA, 16bit A/D converter and USB 2.0 interface enables high-speed processing.
- Optical efficiency is maximized by fiber to slit focusing and alignment mechanism. This realizes high-speed and highly-reproducible measurement of low reflectivity object.
- It is possible to measure imperceptible area (ø50μm) of sample surface. This makes measurement of curved lens surface or micro area coating unevenness possible.
- Excel data can be saved.
- Displaying several measurement results onone screen enables easy sample comparison.